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S. Glenz

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2000 – 2009

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2009
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V. Born, M. Beck, O. Bosholm, D. Dalleau, S. Glenz, I. Haverkamp, G. Kurz, F. Lange, Anja Vest:
Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity. Microelectron. Reliab. 49(1): 74-78 (2009)

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