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John A. McNeill
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2020 – today
- 2022
- [c22]Ian Costanzo, Devdip Sen, John A. McNeill
, Ulkuhan Guler:
A Nonuniform Sampling Lifetime Estimation Technique for Luminescent Oxygen Measurements. ESSCIRC 2022: 413-416
2010 – 2019
- 2018
- [c21]Devdip Sen, John A. McNeill
Time-Domain-Based Measurement Technique for Pressure Measurement in a Wearable Wireless Sensor Patch. ISCAS 2018: 1-5 - [c20]Shanshan Xie, Devdip Sen, John A. McNeill
A Predictive Model for Force-Sensing Resistor Nonlinearity for Pressure Measurement in a Wearable Wireless Sensor Patch. MWSCAS 2018: 476-479 - [c19]Devdip Sen, John A. McNeill
Wireless Sensor Patch Suitable for Continuous Monitoring of Contact Pressure in a Clinical Setting. NEWCAS 2018: 91-95 - [c18]Sulin Li, Jianping Gong, John A. McNeill
VCO-Based ADC With Digital Background Calibration in 65nm CMOS. NEWCAS 2018: 195-199 - [c17]Shahab Farazi, Andrew G. Klein
On the Age of Information in Multi-Source Multi-Hop Wireless Status Update Networks. SPAWC 2018: 1-5 - 2017
- [c16]John A. McNeill
Experimental characterization and modeling of low-cost oscillators for improved carrier phase synchronization. I2MTC 2017: 1-6 - [c15]John A. McNeill
Fundamental limits on energy efficiency performance of VCO-based ADCs. ISCAS 2017: 1-4 - [c14]John A. McNeill
Wearable wireless sensor patch for continuous monitoring of skin temperature, pressure, and relative humidity. ISCAS 2017: 1-4 - 2016
- [c13]John A. McNeill
Flexible sensor for measurement of skin pressure and temperature in a clinical setting. IEEE SENSORS 2016: 1-3 - [c12]Jianping Gong, Sulin Li, John A. McNeill
Sub-picosecond-jitter clock generation for interleaved ADC with Delay-Locked-Loop in 28nm CMOS. ISCAS 2016: 2763-2766 - 2015
- [j9]John A. McNeill
"Split ADC" Background Linearization of VCO-Based ADCs. IEEE Trans. Circuits Syst. I Regul. Pap. 62-I(1): 49-58 (2015) - [c11]John A. McNeill
Session 18 - Data converter techniques. CICC 2015: 1 - 2014
- [c10]John A. McNeill
Lookup-table-based background linearization for VCO-based ADCs. CICC 2014: 1-4 - [c9]John A. McNeill, Mohammad Ranjbar:
Analog techniques. CICC 2014: 1 - 2013
- [c8]Mohammad Ranjbar, John A. McNeill
Nyquist rate A/D converters. CICC 2013: 1 - [c7]John A. McNeill
Split ADC background self-calibration of a 16-b successive approximation ADC in 180nm CMOS. I2MTC 2013: 310-313 - [c6]John A. McNeill
Design of a sub-picosecond-jitter delay-lock-loop for interleaved ADC sample clock synthesis. MWSCAS 2013: 225-228 - 2012
- [c5]Rabeeh Majidi, Anthony Crasso, John A. McNeill
Digital background calibration of redundant split-flash ADC in 45nm CMOS. ISCAS 2012: 1271-1274 - 2011
- [j8]John A. McNeill
All-Digital Background Calibration of a Successive Approximation ADC Using the "Split ADC" Architecture. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(10): 2355-2365 (2011)
2000 – 2009
- 2009
- [j7]John A. McNeill
Digital Background-Calibration Algorithm for "Split ADC" Architecture. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(2): 294-306 (2009) - [j6]John A. McNeill
"Split ADC" Calibration for All-Digital Correction of Time-Interleaved ADC Errors. IEEE Trans. Circuits Syst. II Express Briefs 56-II(5): 344-348 (2009) - [c4]John A. McNeill
Noise in short channel MOSFETs. CICC 2009: 567-572 - 2007
- [c3]John A. McNeill
"Split-ADC" Digital Background Correction of Open-Loop Residue Amplifier Nonlinearity Errors in a 14b Pipeline ADC. ISCAS 2007: 1237-1240 - 2006
- [j5]Jipeng Li, Un-Ku Moon, John A. McNeill
Comments on 'Split ADC' architecture for deterministic digital background calibration of a 16-bit 1-MS/s ADC". IEEE J. Solid State Circuits 41(6): 1481 (2006) - 2005
- [j4]John A. McNeill
"Split ADC" architecture for deterministic digital background calibration of a 16-bit 1-MS/s ADC. IEEE J. Solid State Circuits 40(12): 2437-2445 (2005) - 2004
- [c2]Chengxin Liu, John A. McNeill:
Jitter in oscillators with 1/f noise sources. ISCAS (1) 2004: 773-776 - 2003
- [j3]Yuping Toh, John A. McNeill
Single-ended to differential converter for multiple-stage single-ended ring oscillators. IEEE J. Solid State Circuits 38(1): 141-145 (2003)
1990 – 1999
- 1998
- [j2]Jennifer Stander, John A. McNeill
Multiprobe impedance measurement system for nondestructive evaluation and test of "green state" powder metallurgy parts. IEEE Trans. Instrum. Meas. 47(5): 1367-1371 (1998) - 1997
- [j1]John A. McNeill
Jitter in ring oscillators. IEEE J. Solid State Circuits 32(6): 870-879 (1997) - [c1]John A. McNeill, R. Vat:
Integrating mixed signal IC design research into a project-based undergraduate microelectronics curriculum. MSE 1997: 28-29
Coauthor Index
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