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W. David Ballew

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1990 – 1999

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1992
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W. David Ballew, Lauren M. Streb:
Board-level boundary scan: regaining observability with an additional IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 68-75 (1992)

1980 – 1989

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1989
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W. David Ballew, Lauren M. Streb:
Board-Level Boundary-Scan: Regaining Observability with an Additional IC. ITC 1989: 182-189
1988
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W. David Ballew, Lauren M. Streb:
Elimination of Incoming Test Based Upon In-Process Failure and Repair Costs. ITC 1988: 308-313

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