<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/naic/XunLYYL24" mdate="2025-01-19">
<author orcid="0000-0002-5225-6118">Peng Xun</author>
<author orcid="0009-0007-9222-136X">Tao Li</author>
<author orcid="0009-0004-7624-5095">Yulei Yuan</author>
<author orcid="0009-0007-2113-1754">Hui Yang</author>
<author orcid="0000-0002-3724-6878">Cunlu Li</author>
<title>Xraytest: An X-ray Test system for finding faults of RDMA-NIC Design and Implementation.</title>
<year>2024</year>
<booktitle>NAIC</booktitle>
<ee>https://doi.org/10.1145/3672198.3673802</ee>
<ee>https://www.wikidata.org/entity/Q130964460</ee>
<crossref>conf/naic/2024</crossref>
<url>db/conf/naic/naic2024.html#XunLYYL24</url>
<pages>7-8</pages>
</inproceedings>
</dblp>
