default search action

combined dblp search
author search
venue search
publication search

ask others

"The Test Structure to Measure Polysilicon Seebeck Coefficient for ..."

Sen Zhang, Xiaoping Liao (2019)

> Home

Details and statistics

DOI: 10.1109/NEMS.2019.8915669

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/nems/ZhangL19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/nems/ZhangL19
Sen Zhang, Xiaoping Liao:
The Test Structure to Measure Polysilicon Seebeck Coefficient for Thermoelectric-Photoelectric Integrated Generator. NEMS 2019: 149-152

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.