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"Reusable IO technique for improved utility of IC test circuit area."

Junteng Zhang et al. (2015)

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DOI: 10.1109/ASICON.2015.7517143

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-17

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Junteng Zhang, Jinhui Wang, Ligang Hou, Na Gong:
Reusable IO technique for improved utility of IC test circuit area. ASICON 2015: 1-5

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