default search action

combined dblp search
author search
venue search
publication search

ask others

"Single-Scale Workpiece Defect Detection Based on Deep Learning."

Ming Han, Qingxiang Wu, Xiongjun Zeng (2019)

> Home

Details and statistics

DOI: 10.1109/CISP-BMEI48845.2019.8965923

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/bmei/HanWZ19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/bmei/HanWZ19
Ming Han, Qingxiang Wu, Xiongjun Zeng:
Single-Scale Workpiece Defect Detection Based on Deep Learning. CISP-BMEI 2019: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.