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"Temperature dependence of threshold voltage fluctuations in CMOS ..."

Hal Edwards et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948848

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  - conf/essderc/EdwardsJHCKJ14
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Hal Edwards, Niu Jin, Fan-Chi Hou, Li Jen Choi, Tracey Krakowski, Kuntal Joardar:
Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant. ESSDERC 2014: 413-416

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