default search action

combined dblp search
author search
venue search
publication search

ask others

"Statistical variability in 14-nm node SOI FinFETs and its impact on ..."

Xingsheng Wang et al. (2012)

> Home

Details and statistics

DOI: 10.1109/ESSDERC.2012.6343346

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/essderc/WangCBMA12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/WangCBMA12
Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov:
Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design. ESSDERC 2012: 113-116

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.