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"Diagnostic electromigration reliability evaluation with a local sensing ..."

Fen Chen et al. (2015)

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DOI: 10.1109/IRPS.2015.7112683

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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  dblp key:
  - conf/irps/ChenMCSDPKGS15
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  - https://dblp.org/rec/conf/irps/ChenMCSDPKGS15
Fen Chen, Erik McCullen, Cathryn Christiansen, Michael A. Shinosky, Roger Dufresne, Prakash Periasamy, Rick Kontra, Carole Graas, Gary StOnge:
Diagnostic electromigration reliability evaluation with a local sensing structure. IRPS 2015: 2

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