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"Instabilities of SiC MOSFETs during use conditions and following bias ..."

Gregor Pobegen, Andreas Krassnig (2015)

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DOI: 10.1109/IRPS.2015.7112771

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Gregor Pobegen, Andreas Krassnig:
Instabilities of SiC MOSFETs during use conditions and following bias temperature stress. IRPS 2015: 6

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