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"Characterization of time-dependent variability using 32k transistor arrays ..."

Pieter Weckx et al. (2015)

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DOI: 10.1109/IRPS.2015.7112702

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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  dblp key:
  - conf/irps/WeckxKCFBCWRCG15
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  - https://dblp.org/rec/conf/irps/WeckxKCFBCWRCG15
Pieter Weckx, Ben Kaczer, C. Chen, Jacopo Franco, Erik Bury, K. Chanda, J. Watt, Philippe J. Roussel, Francky Catthoor, Guido Groeseneken:
Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology. IRPS 2015: 3

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