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"LOT-ECC: Localized and tiered reliability mechanisms for commodity memory ..."

Aniruddha N. Udipi et al. (2012)

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DOI: 10.1109/ISCA.2012.6237025

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Aniruddha N. Udipi, Naveen Muralimanohar, Rajeev Balasubramonian, Al Davis, Norman P. Jouppi:
LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems. ISCA 2012: 285-296

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