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"Investigation of BTI reliability for monolithic 3D 6T SRAM with ..."

Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang (2016)

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DOI: 10.1109/ISCAS.2016.7538995

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang:
Investigation of BTI reliability for monolithic 3D 6T SRAM with ultra-thin-body GeOI MOSFETs. ISCAS 2016: 2106-2109

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