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"Interface Trap Analysis in Multi-Fin FinFET Technology: a Crucial ..."

Jyoti Patel et al. (2024)

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DOI: 10.1109/ISCAS58744.2024.10558629

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-16

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Jyoti Patel, Sankalp Rai, Vivek Kumar, Sudeb Dasgupta:
Interface Trap Analysis in Multi-Fin FinFET Technology: a Crucial Reliability Issue in Digital Application. ISCAS 2024: 1-5

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