default search action

combined dblp search
author search
venue search
publication search

ask others

"Analog test bus architecture for small die size and limited pin count ..."

Eduardo Ribeiro da Silva et al. (2009)

> Home

Details and statistics

DOI: 10.1109/LATW.2009.4813800

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/latw/SilvaCBKM09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/latw/SilvaCBKM09
Eduardo Ribeiro da Silva, F. Costa, Frank Herman Behrens, Remerson Stein Kickhofel, Ricardo Maltione:
Analog test bus architecture for small die size and limited pin count devices with internal IPs testability emphasis. LATW 2009: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.