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"A Yield Model for Integrated Circuits and its Application to Statistical ..."

Farid N. Najm, Noel Menezes, Imad A. Ferzli (2007)

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DOI: 10.1109/TCAD.2006.883924

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/NajmMF07
Farid N. Najm, Noel Menezes, Imad A. Ferzli:
A Yield Model for Integrated Circuits and its Application to Statistical Timing Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(3): 574-591 (2007)

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