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"A New Method for March Test Algorithm Generation and Its Application for ..."

Gurgen Harutyunyan et al. (2012)

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DOI: 10.1109/TCAD.2012.2184107

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/HarutyunyanSVZ12
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 941-949 (2012)

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