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"A Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch."

Zhengfeng Huang et al. (2023)

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DOI: 10.1109/TAES.2022.3216795

access: closed

type: Journal Article

metadata version: 2023-07-07

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  - journals/taes/HuangDZNY23
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  - https://dblp.org/rec/journals/taes/HuangDZNY23
Zhengfeng Huang, Lanxi Duan, Yan Zhang, Tianming Ni, Aibin Yan:
A Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch. IEEE Trans. Aerosp. Electron. Syst. 59(3): 2621-2632 (2023)

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