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"Fast Defect Inspection Based on Data-Driven Photometric Stereo."

Mingjun Ren et al. (2019)

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DOI: 10.1109/TIM.2018.2858062

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - journals/tim/RenWXCF19
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  - https://dblp.org/rec/journals/tim/RenWXCF19
Mingjun Ren, Xi Wang, Gaobo Xiao, Minghan Chen, Lin Fu:
Fast Defect Inspection Based on Data-Driven Photometric Stereo. IEEE Trans. Instrum. Meas. 68(4): 1148-1156 (2019)

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