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"AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer."

Kongjing Li et al. (2019)

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DOI: 10.1109/TIE.2018.2886775

access: open

type: Journal Article

metadata version: 2025-01-19

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  - https://dblp.org/rec/journals/tie/LiTCTLLGHW19
Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao, Xiangning He, Nick Wright:
AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer. IEEE Trans. Ind. Electron. 66(10): 8197-8204 (2019)

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