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"Deep reflectance fields: high-quality facial reflectance field inference ..."

Abhimitra Meka et al. (2019)

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DOI: 10.1145/3306346.3323027

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/tog/MekaHPZFFKYBDDB19
Abhimitra Meka, Christian Häne, Rohit Pandey, Michael Zollhöfer, Sean Ryan Fanello, Graham Fyffe, Adarsh Kowdle, Xueming Yu, Jay Busch, Jason Dourgarian, Peter Denny, Sofien Bouaziz, Peter Lincoln, Matt Whalen, Geoff Harvey, Jonathan Taylor, Shahram Izadi, Andrea Tagliasacchi, Paul E. Debevec, Christian Theobalt, Julien P. C. Valentin, Christoph Rhemann:
Deep reflectance fields: high-quality facial reflectance field inference from color gradient illumination. ACM Trans. Graph. 38(4): 77:1-77:12 (2019)

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