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"Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test ..."

Christopher S. Taillefer, Gordon W. Roberts (2005)

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DOI: 10.1109/TVLSI.2005.850113

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/TailleferR05
Christopher S. Taillefer, Gordon W. Roberts:
Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment Without Increasing Test Time. IEEE Trans. Very Large Scale Integr. Syst. 13(7): 852-860 (2005)

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