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"Robust C-element design for soft-error mitigation."

I-Chyn Wey et al. (2015)

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DOI: 10.1587/ELEX.12.20150268

access: open

type: Journal Article

metadata version: 2021-02-12

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  dblp key:
  - journals/ieiceee/WeyWPGY15
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  - https://dblp.org/rec/journals/ieiceee/WeyWPGY15
I-Chyn Wey, Bing-Chen Wu, Chien-Chang Peng, Cihun-Siyong Alex Gong, Changhong Yu:
Robust C-element design for soft-error mitigation. IEICE Electron. Express 12(10): 20150268 (2015)

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