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"Single-ended SRAM with high test coverage and short test time."

Chua-Chin Wang et al. (2000)

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DOI: 10.1109/4.818928

access: closed

type: Journal Article

metadata version: 2022-04-08

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Chua-Chin Wang, Chi-Feng Wu, Rain-Ted Hwang, Chia-Hsiung Kao:
Single-ended SRAM with high test coverage and short test time. IEEE J. Solid State Circuits 35(1): 114-118 (2000)

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