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"Comparative analysis of RF LDMOS capacitance reliability under accelerated ..."
Mohamed Ali Belaïd et al. (2007)
- Mohamed Ali Belaïd, K. Ketata, M. Gares, Karine Mourgues, Mohamed Masmoudi, Jérôme Marcon:
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests. Microelectron. Reliab. 47(1): 59-64 (2007)
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