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"Failure analysis of contact probe pins for SnPb and Sn applications."

Changsoo Jang et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.03.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/JangPILMS08
Changsoo Jang, Seungbae Park, Bill Infantolino, Lawrence Lehman, Ryan Morgan, Dipak Sengupta:
Failure analysis of contact probe pins for SnPb and Sn applications. Microelectron. Reliab. 48(6): 942-947 (2008)

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