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"Device instability of amorphous InGaZnO thin film transistors with ..."

Sang Min Kim et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.037

access: closed

type: Journal Article

metadata version: 2022-04-21

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Sang Min Kim, Min-Ju Ahn, Won-Ju Cho, Jong Tae Park:
Device instability of amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64: 575-579 (2016)

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