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"Reliability testing of flexible printed circuit-based RF MEMS capacitive ..."

Simone Lee et al. (2004)

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DOI: 10.1016/J.MICROREL.2003.09.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Simone Lee, Ramesh Ramadoss, Michael Buck, V. M. Bright, K. C. Gupta, Y. C. Lee:
Reliability testing of flexible printed circuit-based RF MEMS capacitive switches. Microelectron. Reliab. 44(2): 245-250 (2004)

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