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"Bidirectional electromigration failure."

M. K. Lim et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/LimCGD13
M. K. Lim, Vassilios A. Chouliaras, Chee Lip Gan, Vincent M. Dwyer:
Bidirectional electromigration failure. Microelectron. Reliab. 53(9-11): 1261-1265 (2013)

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