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"DRES: Data recovery for condition monitoring to enhance system reliability."

Liansheng Liu et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.101

access: closed

type: Journal Article

metadata version: 2020-02-22

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Liansheng Liu, Dawei Pan, Datong Liu, Yujie Zhang, Yu Peng:
DRES: Data recovery for condition monitoring to enhance system reliability. Microelectron. Reliab. 64: 125-129 (2016)

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