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"Fault localization at high voltage devices using thermally induced voltage ..."

M. Reissner (2007)

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DOI: 10.1016/J.MICROREL.2007.07.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Reissner:
Fault localization at high voltage devices using thermally induced voltage alteration (TIVA). Microelectron. Reliab. 47(9-11): 1561-1564 (2007)

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