default search action

combined dblp search
author search
venue search
publication search

ask others

"Investigation of gate voltage oscillations in an IGBT module after partial ..."

Luowei Zhou, Shengqi Zhou, Mingwei Xu (2013)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2012.08.024

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/ZhouZX13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ZhouZX13
Luowei Zhou, Shengqi Zhou, Mingwei Xu:
Investigation of gate voltage oscillations in an IGBT module after partial bond wires lift-off. Microelectron. Reliab. 53(2): 282-287 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.