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26th NATW 2017: Providence, RI, USA

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2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017. IEEE 2017, ISBN 978-1-5090-5902-7
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Yu Huang:
Case study of bandwidth management in SoC testing. 1-6
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Pavithra Ramesh, Vinay C. Patil, Sandip Kundu:
Peer pressure on identity: On requirements for disambiguating PUFs in noisy environment. 1-4
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Saurabh Gupta, Jennifer Dworak, Daniel Engels, Al Crouch:
Mitigating simple power analysis attacks on LSIB key logic. 1-6
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Konstantinos Poulos, Jayasurya Kuchi, Themistoklis Haniotakis:
An enhanced approach to reduce test application time through limited shift operations in scan chains. 1-4
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Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch:
Detecting a trojan die in 3D stacked integrated circuits. 1-6

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