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IEEE Forum on Research and Technologies for Society and Industry Innovation (RTSI)

IEEE International Forum on Research and Technology for Society and Industry (RTSI) – IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow (RTSI)

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related: IEEE AFRICON (AFRICON)
related: IEEE International Conference on Smart Technologies (EUROCON)

8th RTSI 2024: Milano, Italy

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8th IEEE Forum on Research and Technologies for Society and Industry Innovation, RTSI 2024, Milano, Italy, September 18-20, 2024. IEEE 2024, ISBN 979-8-3503-6213-8 [contents]

7th RTSI 2022: Paris, France

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7th IEEE Forum on Research and Technologies for Society and Industry Innovation, RTSI 2022, Paris, France, August 24-26, 2022. IEEE 2022, ISBN 978-1-6654-9740-4 [contents]

6th RTSI 2021: Naples, Italy

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6th IEEE International Forum on Research and Technology for Society and Industry, RTSI 2021, Naples, Italy, September 6-9, 2021. IEEE 2021, ISBN 978-1-6654-4135-3 [contents]

5th RTSI 2019: Florence, Italy

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5th IEEE International forum on Research and Technology for Society and Industry, RTSI 2019, Florence, Italy, September 9-12, 2019. IEEE 2019, ISBN 978-1-7281-3815-2 [contents]

4th RTSI 2018: Palermo, Italy

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4th IEEE International Forum on Research and Technology for Society and Industry, RTSI 2018, Palermo, Italy, September 10-13, 2018. IEEE 2018, ISBN 978-1-5386-6282-3 [contents]

3rd RTSI 2017: Modena, Italy

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3rd IEEE International Forum on Research and Technologies for Society and Industry, RTSI 2017, Modena, Italy, September 11-13, 2017. IEEE 2017, ISBN 978-1-5386-3906-1 [contents]

2nd RTSI 2016: Bologna, Italy

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2nd IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow, RTSI 2016, Bologna, Italy, September 7-9, 2016. IEEE 2016, ISBN 978-1-5090-1131-5 [contents]

1st RTSI 2015: Turin, Italy

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1st IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow, RTSI 2015, Torino, Italy, September 16-18, 2015. IEEE 2015, ISBN 978-1-4673-8167-3 [contents]

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