Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. - Champac, Víctor H.; Villacorta, Hector; Gómez-Fuentes, Roberto; Vargas, Fabian; Segura, Jaume (J. Electron. Test., 2024)

Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations. - Champac, Víctor H.; Villacorta, Hector; Gómez-Fuentes, Roberto; Vargas, Fabian; Segura, Jaume (2022)

Identification of Logic Paths Influenced by Severe Coupling Capacitances. - Meza-Ibarra, Ivan D.; Champac, Víctor H.; Gómez-Fuentes, Roberto; Noriega-Luna, Jose R.; Vera-Marquina, A. (J. Electron. Test., 2020)

Identification of Logic Paths Influenced by Severe Coupling Capacitances. - Meza-Ibarra, Ivan D.; Champac, Víctor H.; Gómez-Fuentes, Roberto; Noriega-Luna, Jose R.; Vera-Marquina, A. (2019)

A metric-guided gate-sizing methodology for aging guardband reduction. - Gomez, Andres F.; Gómez, Roberto; Champac, Víctor H. (2018)

Repulsive Function in Potential Field Based Control with Algorithm for Safer Avoidance. - García-Delgado, Luis; Noriega-Luna, Jose R.; Berman-Mendoza, D.; Leal-Cruz, Ana Lilia; Vera-Marquina, A.; Gómez-Fuentes, Roberto; García-Juárez, Alejandro; Rojas-Hernández, A. G.; Zaldívar-Huerta, Ignacio E. (J. Intell. Robotic Syst., 2015)

Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell. - Villacorta, Hector; Gómez, Roberto; Bota, Sebastià A.; Segura, Jaume; Champac, Víctor H. (2015)

An Approach for Optimal Goal Position Assignment in Vehicle Formations. - García-Delgado, Luis; Gómez-Fuentes, Roberto; García-Juárez, Alejandro; Leal-Cruz, Ana Lilia; Berman-Mendoza, D.; Vera-Marquina, A.; Rojas-Hernández, A. G. (J. Intell. Robotic Syst., 2014)

Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. - Villacorta, Hector; Hawkins, Charles F.; Champac, Víctor H.; Segura, Jaume; Gómez, Roberto (IEEE Des. Test, 2013)

Testing of Stuck-Open Faults in Nanometer Technologies. - Champac, Víctor H.; Hernandez, Julio Vazquez; Barceló, Salvador; Gómez, Roberto; Hawkins, Chuck; Segura, Jaume (IEEE Des. Test Comput., 2012)

A modern look at the CMOS stuck-open fault. - Gómez, Roberto; Champac, Víctor H.; Hawkins, Chuck; Segura, Jaume (2009)

A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. - Gómez, Roberto; Girón, Alejandro; Champac, Víctor H. (J. Electron. Test., 2008)

Test of Interconnection Opens Considering Coupling Signals. - Gómez, Roberto; Girón, Alejandro; Champac, Víctor H. (2005)