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Alessandro Grossi
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2020 – today
- 2023
- [c7]Alessandro Grossi, Matteo Coppetta, Stefano Aresu, Andreas Kux, Thomas Kern, Robert Strenz:
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers. IMW 2023: 1-4
2010 – 2019
- 2019
- [c6]Mamathamba Kalishettyhalli Mahadevaiah, Eduardo Pérez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Finn Zahari, Hermann Kohlstedt, Martin Ziegler:
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing. IRPS 2019: 1-4 - 2018
- [j3]Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay:
An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays. IEEE Trans. Emerg. Top. Comput. 6(2): 269-277 (2018) - [j2]Alessandro Grossi, Elisa Vianello, Cristian Zambelli, Pablo Royer, Jean-Philippe Noel, Bastien Giraud, Luca Perniola, Piero Olivo, Etienne Nowak:
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM. IEEE Trans. Very Large Scale Integr. Syst. 26(12): 2599-2607 (2018) - [c5]Denys R. B. Ly, Alessandro Grossi, Thilo Werner, Thomas Dalgaty, Claire Fenouillet-Béranger, Elisa Vianello, Etienne Nowak:
Role of synaptic variability in spike-based neuromorphic circuits with unsupervised learning. ISCAS 2018: 1-5 - 2017
- [c4]Elisa Vianello, Thilo Werner, Alessandro Grossi, Etienne Nowak, Barbara De Salvo, Luca Perniola, Olivier Bichler, Blaise Yvert:
Bioinspired Programming of Resistive Memory Devices for Implementing Spiking Neural Networks. ACM Great Lakes Symposium on VLSI 2017: 393-398 - 2016
- [p1]Alessandro Grossi, Cristian Zambelli, Piero Olivo:
Reliability of 3D NAND Flash Memories. 3D Flash Memories 2016: 29-62 - 2015
- [c3]Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay:
Automated characterization of TAS-MRAM test arrays. DTIS 2015: 1-2 - [c2]Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger:
RRAM Reliability/Performance Characterization through Array Architectures Investigations. ISVLSI 2015: 327-332 - [c1]Alessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay:
Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions. NVMTS 2015: 1-4
2000 – 2009
- 2000
- [j1]Giovanni Campardo, Rino Micheloni, Stefano Commodaro, Emilio Yero, Matteo Zammattio, Sabina Mognoni, Andrea Sacco, Massimiliano Picca, Alessandro Manstretta, Marco Scotti, Ilaria Motta, C. Golla, Andrea Pierin, Roberto Bez, Alessandro Grossi, Alberto Modelli, Angelo Visconti, Osama Khouri, Guido Torelli:
40-mm2 3-V-only 50-MHz 64-Mb 2-b/cell CHE NOR flash memory. IEEE J. Solid State Circuits 35(11): 1655-1667 (2000)
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