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Theodor Hillebrand
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2010 – 2019
- 2018
- [j2]Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen:
Design for reliability of generic sensor interface circuits. Microelectron. Reliab. 80: 184-197 (2018) - [c15]Theodor Hillebrand, Ludwig Karsthof, Steffen Paul, Dagmar Peters-Drolshagen:
Reliability-Aware Multi-Vth Domain Digital Design Assessment. DDECS 2018: 1-4 - [c14]Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
A New Approach to Threshold Voltage Measurements of Transistors. IOLTS 2018: 207-213 - [c13]Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
Topology-Driven Reliability Assessment of Integrated Circuits. MIXDES 2018: 198-203 - [c12]Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
LUT-Based Stochastic Modeling for Non-Normal Performance Distributions. SMACD 2018: 1-217 - [c11]Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability. SMACD 2018: 65-68 - [c10]Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
On-line monitoring and error correction in sensor interface circuits using digital calibration techniques. VTS 2018: 1-6 - 2017
- [j1]Timur Schafer, Theodor Hillebrand, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul:
Design and Verification of Analog CMOS Circuits Using the g m/I D-Method with Age-Dependent Degradation Effects. J. Low Power Electron. 13(1): 135-147 (2017) - [c9]Sascha Heinssen, Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
Behavioral modeling of a sensor interface circuit including various non-idealities. SMACD 2017: 1-4 - [c8]Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
Variation- and degradation-aware stochastic behavioral modeling of analog circuit components. SMACD 2017: 1-4 - 2016
- [c7]Theodor Hillebrand, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
Reliability-aware design method for CMOS circuits. ERMAVSS@DATE 2016: 17-20 - [c6]Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process. IOLTS 2016: 121-125 - [c5]Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen:
Online monitoring of NBTI and HCD in beta-multiplier circuits. IOLTS 2016: 209-210 - [c4]Maike Taddiken, Theodor Hillebrand, Konstantin Tscherkaschin, Steffen Paul
, Dagmar Peters-Drolshagen:
Parameter identification for behavioral modeling of analog components including degradation. MIXDES 2016: 336-340 - [c3]Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul
Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process. MIXDES 2016: 353-358 - [c2]Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul
Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits. MIXDES 2016: 363-368 - [c1]Theodor Hillebrand, Timur Schafer, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul:
Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects. PATMOS 2016: 136-141
Coauthor Index
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