An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation - Saqib A. Khan; Chul Seung Lim; GeunYong Bak; Sanghyeon Baeg; Soonyoung Lee (Microelectron. Reliab., 2017)

Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation - Saqib A. Khan; Shi-Jie Wen; Sanghyeon Baeg (IEICE Electron. Express, 2016)

Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627] - Saqib A. Khan; Shi-Jie Wen; Sanghyeon Baeg (IEICE Electron. Express, 2016)