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Fu-Chung Hou

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2010 – 2019

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2011
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Chun-Chang Lu, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Shih-Cheng Chang, Tien-Ko Wang, Fu-Chung Hou, Yao-Tung Hsu:
Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs. Microelectron. Reliab. 51(12): 2110-2114 (2011)

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