Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation. - Guo, Nanlin; Peng, Fulin; Shi, Jiahe; Yang, Fan; Tao, Jun; Zeng, Xuan (ACM Trans. Design Autom. Electr. Syst., 2024)

Efficient Statistical Analysis for Correlated Rare Failure Events via Asymptotic Probability Approximation. - Peng, Fulin; Yu, Handi; Tao, Jun; Su, Yangfeng; Zhou, Dian; Zeng, Xuan; Li, Xin (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

A general graph based pessimism reduction framework for design optimization of timing closure. - Peng, Fulin; Yan, Changhao; Feng, Chunyang; Zheng, Jianquan; Wang, Sheng-Guo; Zhou, Dian; Zeng, Xuan (2018)

A Memristor Crossbar-Based Computation Scheme with High Precision. - Li, Junyi; Peng, Fulin; Yang, Fan; Zeng, Xuan (CoRR, 2016)