Defect detection in analog and mixed circuits by neural networks using wavelet analysis - Viera Stopjaková; Pavol Malosek; Marek Matej; Vladislav Nagy; Martin Margala (IEEE Trans. Reliab., 2005)

Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks - Viera Stopjaková; Pavol Malosek; Daniel Micusík; Marek Matej; Martin Margala (J. Electron. Test., 2004)

A Rapid Prototyping Methodology and Platform for Seamless Communication Systems - Milan Vasilko; Lukas Machácek; Marek Matej; Piotr Stepien; Steve Holloway (12th IEEE International Workshop on Rapid System Prototyping (RSP 2001), 25-27 June 2001, Monterey, CA, USA, 2001)