Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage - Wu-Tung Cheng; Manish Sharma; Xin Yang; Artur Stelmach; Szczepan Urban; Jakub Janicki; Preston McWithey (IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024, 2024)

Global Control Signal Defect Diagnosis in Volume Production Environment - Szczepan Urban; Piotr Zimnowlodzki; Manish Sharma; Shraddha Bodhe; John Schulze; Abdullah Yassine; Adam Styblinski (IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, 2023)

Predicting the Resolution of Scan Diagnosis - Manoj Devendhiran; Jakub Janicki; Szczepan Urban; Manish Sharma; Jayant D'Souza (IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, 2023)

Industry Evaluation of Reversible Scan Chain Diagnosis - Soumya Mittal; Szczepan Urban; Kun Young Chung; Jakub Janicki; Wu-Tung Cheng; Martin Parley; Manish Sharma; Shaun Nicholson (IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, 2022)

Scan Chain Diagnosis-Driven Test Response Compactor - Jakub Janicki; Grzegorz Mrugalski; Artur Stelmach; Szczepan Urban (29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020, 2020)

Non-Adaptive Pattern Reordering to Improve Scan Chain Diagnostic Resolution - Yu Huang; Jakub Janicki; Szczepan Urban (24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019, 2019)

Reversible Scan Based Diagnostic Patterns - Yu Huang; Szczepan Urban; Wu-Tung Cheng; Manish Sharma; Fengju Niu; Junna Zhong; Wen-Lung Hsu (International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019, Hsinchu, Taiwan, April 22-25, 2019, 2019)