Data Center Silent Data Errors: Implications to Artificial Intelligence Workloads & Mitigations - B. Bittel; M. Shamsa; Benson Inkley; A. Gur; David P. Lerner; M. Adams (IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024, 2024)

Optimization of Tests for Managing Silicon Defects in Data Centers - David P. Lerner; Benson Inkley; Shubhada H. Sahasrabudhe; Ethan Hansen; Luis D. Rojas Munoz; Arjan van de Ven (IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, 2022)