Calibration for Industrial Optical High-Resolution Microimaging Systems - Zijian Zhu; Chenyang Zhao; Xinming Fang (IEEE Trans. Ind. Electron., 2024)

An Investigation of the Influence of Light Intensity on Microscopic Imaging in Nanoscale Positioning Measurement - Xinming Fang; Zijian Zhu; Chenyang Zhao (IEEE Trans. Instrum. Meas., 2024)

Defect Sample Image Generation Method Based on GANs in Diamond Tool Defect Detection - Chenyang Zhao; Wen Xue; Wenpeng Fu; Zhang-Qing Li; Xinming Fang (IEEE Trans. Instrum. Meas., 2023)