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Jong Tae Park 0003
Person information
- affiliation: Incheon National University (INU), Department of Electronics Engineering, Republic of Korea
- affiliation: University of Incheon (UI), Department of Electronics Engineering, Republic of Korea
Other persons with the same name
- Jong-Tae Park (aka: Jong Tae Park) — disambiguation page
- Jong-Tae Park 0001 (aka: Jong Tae Park 0001) — Kyungpook National University, School of Electrical Engineering and Computer Science, Daegu, Korea (and 2 more)
- Jong-Tae Park 0002
— Chungnam National University, College of Agriculture and Life Science, Daejeon, Korea
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2010 – 2019
- 2018
- [j33]Eun-Jung Yoon, Jong-Tae Park, Chong-Gun Yu
Thermal energy harvesting circuit with maximum power point tracking control for self-powered sensor node applications. Frontiers Inf. Technol. Electron. Eng. 19(2): 285-296 (2018) - [j32]Hee Pyung Park, Sang Woo Kim, Joong-Won Shin, Won-Ju Cho, Jong Tae Park:
Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors. Microelectron. Reliab. 88-90: 873-877 (2018) - 2017
- [j31]Sang Min Kim, Min-Soo Kang, Won-Ju Cho, Jong Tae Park:
Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with ITO local conducting buried layer. Microelectron. Reliab. 76-77: 327-332 (2017) - [j30]Hyun Jong Kim, Byung Sang Song, Won-Ju Cho, Jong Tae Park:
Reliability of amorphous InGaZnO TFTs with ITO local conducting buried layer for BEOL power transistors. Microelectron. Reliab. 76-77: 333-337 (2017) - 2016
- [j29]Jin Hyung Choi, Chong-Gun Yu
Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectron. Reliab. 64: 215-219 (2016) - [j28]Hyun Jun Jang, Chong-Gun Yu
Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors. Microelectron. Reliab. 64: 570-574 (2016) - [j27]Sang Min Kim, Min-Ju Ahn, Won-Ju Cho, Jong Tae Park:
Device instability of amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64: 575-579 (2016) - [j26]Jong Hoon Lee, Seul Ki Yu, Jae Won Kim, Min-Ju Ahn, Won-Ju Cho, Jong Tae Park:
Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64: 580-584 (2016) - 2015
- [j25]Jin Hyung Choi, Jong Tae Park:
Wire width dependence of hot carrier degradation in silicon nanowire gate-all-around MOSFETs. Microelectron. Reliab. 55(9-10): 1438-1441 (2015) - [j24]Jae Hoon Lee, Jin-Woo Han, Chong-Gun Yu
Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs. Microelectron. Reliab. 55(9-10): 1456-1459 (2015) - [j23]Dae Hyun Kim, Jong Tae Park:
Investigation on stress induced hump phenomenon in IGZO thin film transistors under negative bias stress and illumination. Microelectron. Reliab. 55(9-10): 1811-1814 (2015) - 2014
- [j22]Dae Hyun Kim, Jong Tae Park:
The effect of gate overlap on the device degradation in IGZO thin film transistors. Microelectron. Reliab. 54(9-10): 2167-2170 (2014) - [j21]Jae Hoon Lee, Jong Tae Park:
Crystallographic-orientation-dependent GIDL current in Tri-gate MOSFETs under hot carrier stress. Microelectron. Reliab. 54(9-10): 2315-2318 (2014) - [j20]Jin Hyung Choi, Jin-Woo Han, Chong-Gun Yu
Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. Microelectron. Reliab. 54(9-10): 2325-2328 (2014) - 2013
- [j19]Seung Min Lee, Hyun Jun Jang, Jong Tae Park:
Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors. Microelectron. Reliab. 53(9-11): 1329-1332 (2013) - [j18]Hyun Jun Jang, Seung Min Lee, Chong-Gun Yu
A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors. Microelectron. Reliab. 53(9-11): 1814-1817 (2013) - 2012
- [j17]Hongbin Shi, F. X. Che, Cuihua Tian, Rui Zhang, Jong Tae Park, Toshitsugu Ueda:
Analysis of edge and corner bonded PSvfBGA reliability under thermal cycling conditions by experimental and finite element methods. Microelectron. Reliab. 52(9-10): 1870-1875 (2012) - [j16]Seung Min Lee, Chong-Gun Yu
Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs. Microelectron. Reliab. 52(9-10): 1945-1948 (2012) - [j15]Rui Zhang, Hongbin Shi, Yuehong Dai, Jong Tae Park, Toshitsugu Ueda:
Thermo-mechanical reliability optimization of MEMS-based quartz resonator using validated finite element model. Microelectron. Reliab. 52(9-10): 2331-2335 (2012) - [j14]Seul Ki Lee, Sung Il Hong, Yeon Ho Lee, Se Won Lee, Won-Ju Cho, Jong Tae Park:
Comparative study of electrical instabilities in InGaZnO thin film transistors with gate dielectrics. Microelectron. Reliab. 52(9-10): 2504-2507 (2012) - 2011
- [j13]Seung Min Lee, Dong Hun Lee, Jae Ki Lee, Jong Tae Park:
Concurrent PBTI and hot carrier degradation in n-channel MuGFETs. Microelectron. Reliab. 51(9-11): 1544-1546 (2011) - [j12]Jin-Young Kim, Chong-Gun Yu
Effects of device layout on the drain breakdown voltages in MuGFETs. Microelectron. Reliab. 51(9-11): 1547-1550 (2011) - 2010
- [j11]Jin-Young Kim, Jun-Seok Oh, Won-Ju Cho, Jong Tae Park:
NBTI and hot carrier effect of Schottky-barrier p-MOSFETs. Microelectron. Reliab. 50(9-11): 1290-1293 (2010) - [j10]Dong Wook Kim, Woo Sang Park, Jong Tae Park:
The optimum fin width in p-MuGFETs with the consideration of NBTI and hot carrier degradation. Microelectron. Reliab. 50(9-11): 1316-1319 (2010)
2000 – 2009
- 2009
- [j9]Yong Woo Jeon, Dae Hyun Ka, Chong-Gun Yu
NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer. Microelectron. Reliab. 49(9-11): 994-997 (2009) - [j8]Chi-Woo Lee, Isabelle Ferain, Aryan Afzalian, Ran Yan, Nima Dehdashti
NBTI and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs. Microelectron. Reliab. 49(9-11): 1044-1047 (2009) - 2007
- [j7]Sung Jun Jang, Dae Hyun Ka, Chong-Gun Yu
Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs. Microelectron. Reliab. 47(9-11): 1411-1415 (2007) - 2006
- [j6]In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. Microelectron. Reliab. 46(9-11): 1864-1867 (2006) - 2005
- [j5]Jong Hun Kim, Kyosun Kim, Seok Hee Jeon, Jong Tae Park:
Reliability improvement by the suppression of keyhole generation in W-plug vias. Microelectron. Reliab. 45(9-11): 1455-1458 (2005) - 2004
- [j4]Byung-Jin Lee, Kyosun Kim, Jong Tae Park:
Effects of hot carrier stress on the RF performance in SOI MOSFETs. Microelectron. Reliab. 44(9-11): 1637-1642 (2004) - [j3]Se Re Na Yun, Chong-Gun Yu
Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's. Microelectron. Reliab. 44(9-11): 1649-1654 (2004) - 2003
- [j2]Jong Tae Park, Nag Jong Choi, Chong-Gun Yu
Increased hot carrier effects in Gate-All-Around SOI nMOSFET's. Microelectron. Reliab. 43(9-11): 1427-1432 (2003) - [j1]Se Re Na Yun, Won Sub Park, Byung Ha Lee, Jong Tae Park:
Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures. Microelectron. Reliab. 43(9-11): 1477-1482 (2003)
Coauthor Index
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