default search action
Harald Gossner
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2018
- [c8]Milova Paul, Boeila Sampath Kumar, Harald Gossner
, Mayank Shrivastava:
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability. IRPS 2018: 3 - 2017
- [c7]Milova Paul, Christian Russ, Boeila Sampath Kumar, Harald Gossner
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete? VLSID 2017: 391-394 - 2016
- [c6]Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner
A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package. VLSID 2016: 156-161 - 2015
- [j13]Harald Gossner
System efficient ESD design. Microelectron. Reliab. 55(12): 2607-2613 (2015) - 2012
- [c5]Michael G. Khazhinsky, Shuqing Cao, Harald Gossner
Electronic design automation (EDA) solutions for ESD-robust design and verification. CICC 2012: 1-8 - 2010
- [j12]Harald Gossner
System ESD robustness by co-design of on-chip and on-board protection measures. Microelectron. Reliab. 50(9-11): 1359-1366 (2010)
2000 – 2009
- 2009
- [j11]Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner
Do ESD fails in systems correlate with IC ESD robustness? Microelectron. Reliab. 49(9-11): 1079-1085 (2009) - [j10]Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner
Reliability aspects of gate oxide under ESD pulse stress. Microelectron. Reliab. 49(12): 1407-1416 (2009) - 2007
- [j9]Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner
RF ESD protection strategies: Codesign vs. low-C protection. Microelectron. Reliab. 47(7): 1008-1015 (2007) - [c4]Moon-Jung Kim, Henrik Icking, Harald Gossner
High-Voltage-Tolerant I/O Circuit Design for USB 2.0-Compliant Applications. CICC 2007: 491-494 - [c3]Wolfgang Soldner, Moon-Jung Kim, Martin Streibl, Harald Gossner
A 10GHz Broadband Amplifier with Bootstrapped 2kV ESD Protection. ISSCC 2007: 550-551 - 2006
- [c2]Christian Pacha, Klaus von Arnim, Thomas Schulz, Weize Xiong, Michael Gostkowski, Gerhard Knoblinger, Andrew Marshall, Thomas Nirschl, Jörg Berthold, Christian Russ, Harald Gossner, Charvaka Duvvury, Paul Patruno, C. Rinn Cleavelin, Klaus Schruefer:
Circuit design issues in multi-gate FET CMOS technologies. ISSCC 2006: 1656-1665 - 2005
- [j8]Martin Streibl, Franz Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner
High abstraction level permutational ESD concept analysis. Microelectron. Reliab. 45(2): 313-321 (2005) - [j7]Heinrich Wolf, Horst A. Gieser
A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits. Microelectron. Reliab. 45(9-11): 1421-1424 (2005) - 2004
- [c1]Harald Gossner:
ESD protection for the deep sub micron regime - a challenge for design methodology. VLSI Design 2004: 809- - 2003
- [j6]Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectron. Reliab. 43(7): 1001-1010 (2003) - 2002
- [j5]Wolfgang Stadler, Kai Esmark, Harald Gossner
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectron. Reliab. 42(9-11): 1267-1274 (2002) - [j4]Franz Zängl, Harald Gossner
Case study of a technology transfer causing ESD problems. Microelectron. Reliab. 42(9-11): 1275-1280 (2002) - 2001
- [j3]Harald Gossner
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. Microelectron. Reliab. 41(3): 385-393 (2001) - [j2]Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectron. Reliab. 41(9-10): 1385-1390 (2001) - [j1]Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner
Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase. Microelectron. Reliab. 41(11): 1761-1770 (2001)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 23:18 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: