default search action

combined dblp search
author search
venue search
publication search

ask others

Tristan Dubois

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2020 – today

see FAQ

What is the meaning of the colors in the publication lists?

2024
[c5]
- view
  authority control:
- export record
  dblp key:
  - conf/emccompo/DuguetDDHS24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/emccompo/DuguetDDHS24
Antoine Duguet, Tristan Dubois, Geneviève Duchamp, David Hardy, Franck Salvador:
Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform. EMC Compo 2024: 1-6
[c4]
- view
  authority control:
- export record
  dblp key:
  - conf/emccompo/BihanDBA24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/emccompo/BihanDBA24
Soazig Le Bihan, Tristan Dubois, Jean-Baptiste Bégueret, Adil El Abbazi:
Enhancing High-Speed Ethernet Link Design at 25 Gbps in Aerospace Environments Through Optimization Algorithms. EMC Compo 2024: 74-79
2020
[c3]
- view
  authority control:
- export record
  dblp key:
  - conf/icit2/CurosDMPV20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icit2/CurosDMPV20
L. Curos, Tristan Dubois, G. Mejecaze, F. Puybaret, Jean-Michel Vinassa:
Susceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection. ICIT 2020: 511-516

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2018
[j7]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/GirardDHD18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/GirardDHD18
M. Girard, Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp:
Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale. Microelectron. Reliab. 88-90: 914-919 (2018)
2017
[j6]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/Hairoud-Airieau17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/Hairoud-Airieau17
S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont:
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. Microelectron. Reliab. 76-77: 674-679 (2017)
2015
[j5]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/DuboisHOFD15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/DuboisHOFD15
Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp:
Characterization and model of temperature effect on the conducted immunity of Op-Amp. Microelectron. Reliab. 55(9-10): 2055-2060 (2015)
[j4]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/AyedDLD15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/AyedDLD15
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp:
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Microelectron. Reliab. 55(9-10): 2067-2071 (2015)
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/tim/AyedDLD15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/AyedDLD15
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp:
A New Method for the Characterization of Electronic Components Immunity. IEEE Trans. Instrum. Meas. 64(9): 2496-2503 (2015)
2013
[c2]
- view
  authority control:
- export record
  dblp key:
  - conf/emccompo/HairoudDTD13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/emccompo/HairoudDTD13
Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp:
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling. EMC Compo 2013: 53-58
2011
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/latw/JarrixDCHDBDRC11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/latw/JarrixDCHDBDRC11
Sylvie Jarrix, Laurent Dusseau, Nathalie Chatry, Patrick Hoffmann, Adrien Doridant, A. Blain, Tristan Dubois, Jérémy Raoult, Philippe Calvel:
First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors. LATW 2011: 1-4
2010
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/tim/JarrixDANAG10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/JarrixDANAG10
Sylvie Jarrix, Tristan Dubois, R. Adam, Philippe Nouvel, Bruno Azaïs, Daniel Gasquet:
Probe Characterization for Electromagnetic Near-Field Studies. IEEE Trans. Instrum. Meas. 59(2): 292-300 (2010)

2000 – 2009

see FAQ

What is the meaning of the colors in the publication lists?

2008
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/tim/DuboisJPNGCA08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/DuboisJPNGCA08
Tristan Dubois, Sylvie Jarrix, Annick Penarier, Philippe Nouvel, Daniel Gasquet, Laurent Chusseau, Bruno Azaïs:
Near-Field Electromagnetic Characterization and Perturbation of Logic Circuits. IEEE Trans. Instrum. Meas. 57(11): 2398-2404 (2008)

Coauthor Index

see FAQ

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.