Biased Voting for Improved Yield in Nanoscale Fabrics - Md. Muwyid U. Khan; Pritish Narayanan; Priyamvada Vijayakumar; Israel Koren; C. Mani Krishna; Csaba Andras Moritz (2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011, 2011)