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Sang-Bum Huh

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2000 – 2009

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2005
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Soon-Young Oh, Jang-Gn Yun, Bin-Feng Huang, Yong-Jin Kim, Hee-Hwan Ji, Sang-Bum Huh, Han-Seob Cha, Ui-Sik Kim, Jin-Suk Wang, Hi-Deok Lee:
Thermally Robust Nickel Silicide Process for Nano-Scale CMOS Technology. IEICE Trans. Electron. 88-C(4): 651-655 (2005)

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